A morphologically self-consistent phase field model for the computational study of memristive thin film current–voltage hysteresis

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0290458
Affiliations:
3
Authors:
3
Institutions Authors Share
Embry-Riddle Aeronautical University (ERAU), United States of America (USA)
2.000000
0.67
University of California, Santa Cruz (UCSC), United States of America (USA)
1.000000
0.33