Nanoscale thermal effect induced in situ Cu-based memristor

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0301433
Affiliations:
4
Authors:
10
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Institutions Authors Share
Harbin Engineering University (HEU), China
9.000000
 0.90
Inonu University, Turkey
1.000000
 0.10
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