Thickness-dependent optical and structural properties of chalcogenide phase-change memory thin films grown at room temperature by pulsed laser deposition

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0302043
Affiliations:
2
Authors:
3
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Institutions Authors Share
Leibniz Institute of Surface Engineering (IOM), Germany
2.000000
 0.67
V. Ye. Lashkaryov Institute of Semiconductor Physics, NASU, Ukraine
1.000000
 0.33
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