Experimental and modeled analysis of source-line loading effects in NOR flash compute-in-memory arrays

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0304098
Affiliations:
2
Authors:
7
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Institutions Authors Share
Winbond Electronics Corp., Taiwan
5.000000
 0.71
National Cheng Kung University (NCKU), Taiwan
2.000000
 0.29
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