Temperature imaging of chips with high spatiotemporal resolution using diamond nitrogen-vacancy centers

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0305268
Affiliations:
3
Authors:
9
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Institutions Authors Share
State Key Laboratory of Extreme Environment Optoelectronic Dynamic Testing Technology and Instrument, NUC, China
5.000000
 0.56
North University of China (NUC), China
4.000000
 0.44
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