Deep ultraviolet photodetector based on high-quality cubic-AlN single-crystal films with nitrogen vacancies

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0307649
Affiliations:
2
Authors:
8
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Institutions Authors Share
MOE Key Laboratory of Special Function Materials and Structure Design, LZU, China
6.000000
 0.75
Hebei Semiconductor Research Institute (CETC13), China
2.000000
 0.25
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