Determination of composition, strain, and layer thickness of germanium-tin superlattices using x-ray diffraction

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0308927
Affiliations:
4
Authors:
10
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Institutions Authors Share
University of Arkansas (UARK), United States of America (USA)
9.000000
 0.90
Institute of Physics, PAS, Poland
1.000000
 0.10
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