Nanoscale carrier distribution and trap dynamics in supported and suspended WSe2 layers studied by scanning nonlinear dielectric microscopy
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0309146
- Affiliations:
- 4
- Authors:
- 4
| Institutions | Authors | Share |
|---|---|---|
| Tohoku University, Japan | 0.88 | |
| WPI Advanced Institute for Materials Research (WPI-AIMR), Tohoku University, Japan | 0.13 |