A weakness breakdown model of a BOPP film based on blister growth under cyclic pulsed voltage

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0310856
Affiliations:
2
Authors:
5
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Institutions Authors Share
Fuzhou University (FZU), China
4.500000
 0.90
Department of Electrical Engineering, Tsinghua, China
0.500000
 0.10
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