Retention improvement in vertical NAND flash memory using block soft erase scheme
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0310928
- Affiliations:
- 2
- Authors:
- 6
| Institutions | Authors | Share |
|---|---|---|
| Seoul National University (SNU), South Korea | 0.83 | |
| SK Hynix Inc., South Korea | 0.17 |