Effect of substrate miscut angle on critical thickness, structural and electronic properties of MBE-grown NbN films on c-plane sapphire

Journal:

Applied Physics Letters

Published:

2026-01-26

DOI:

10.1063/5.0312575

Affiliations:

5

Authors:

10

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Institutions	Authors	Share
Cornell University, United States of America (USA)	8.166667	0.82
Kavli Institute at Cornell for Nanoscale Science, United States of America (USA)	1.500000	0.15
Leibniz-Institut für Kristallzüchtung im Forschungsverbund Berlin e.V. (IKZ), Germany	0.333333	0.03

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