Direct nanoscale characterization of polarization-dependent diffusion in non-polar GaN via scanning diffusion microscopy

Journal:

Applied Physics Letters

Published:

2026-03-16

DOI:

10.1063/5.0312818

Affiliations:

5

Authors:

8

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Institutions	Authors	Share
Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), CAS, China	7.066667	0.88
Suzhou Nanowin Science and Technology Co., Ltd., China	0.533333	0.07
Shenyang National Laboratory for Materials Science (SYNL), IMR CAS, China	0.200000	0.03
Jiangsu Institute of Advanced Semiconductors Ltd., China	0.200000	0.03

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