Detection, identification, and impact of native point defects on conduction in ITO thin films

Journal:

Applied Physics Letters

Published:

2026-05-04

DOI:

10.1063/5.0313344

Affiliations:

6

Authors:

7

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Institutions	Authors	Share
The Ohio State University (OSU), United States of America (USA)	2.000000	0.29
University of Delaware (UD), United States of America (USA)	2.000000	0.29
Wright State University, United States of America (USA)	1.000000	0.14
USAF Air Force Research Laboratory (AFRL), United States of America (USA)	1.000000	0.14
Paul Drude Institute for Solid State Electronics (PDI), Germany	1.000000	0.14

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