Study of leakage current in GaN junction field-effect transistor under heavy ion radiation
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0313387
- Affiliations:
- 3
- Authors:
- 6
| Institutions | Authors | Share |
|---|---|---|
| The Pennsylvania State University (Penn State), United States of America (USA) | 0.50 | |
| University of Illinois at Urbana-Champaign (UIUC), United States of America (USA) | 0.50 |