Electron drift velocity measurement of AlGaN/GaN single- and multi-channel Fin structures

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0314039
Affiliations:
2
Authors:
12
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Institutions Authors Share
Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO), CAS, China
7.000000
 0.58
University of Science and Technology of China (USTC), China
5.000000
 0.42
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