Spectroscopic imaging- and micro-ellipsometry of MXene-based microelectronic devices

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0314586
Affiliations:
3
Authors:
6
Go to article
Institutions Authors Share
Helmholtz-Zentrum Berlin for Materials and Energy (HZB), Germany
2.000000
 0.33
Hebrew University of Jerusalem (HUJI), Israel
2.000000
 0.33
Tel Aviv University (TAU), Israel
2.000000
 0.33
Interested in Chemical Engineering?