Stress-induced efficiency degradation mechanism of InGaN-based red micro-LEDs depending on their size
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0315804
- Affiliations:
- 4
- Authors:
- 10
| Institutions | Authors | Share |
|---|---|---|
| Korea Institute of Energy Technology (KENTECH), South Korea | 0.30 | |
| WaveLord Inc., South Korea | 0.30 | |
| Hanyang University (HYU), South Korea | 0.30 | |
| Pukyong National University (PKNU), South Korea | 0.10 |