Diffraction contrast imaging of hydrogen passivation of silicon using helium microscopy

Journal:

Applied Physics Letters

Published:

2026-03-16

DOI:

10.1063/5.0319099

Affiliations:

2

Authors:

9

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Institutions	Authors	Share
University of Cambridge, United Kingdom (UK)	8.500000	0.94
The University of Newcastle (UON), Australia	0.500000	0.06

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