Evolution of the below-bandgap anisotropic refractive indices and dielectric functions of -(AlxGa1−x)2O3 (0 < x < 0.25) determined by generalized spectroscopic ellipsometry

Journal:

Applied Physics Letters

Published:

2026-03-23

DOI:

10.1063/5.0320403

Affiliations:

10

Authors:

10

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Institutions	Authors	Share
University of California, Santa Barbara (UCSB), United States of America (USA)	3.000000	0.30
University of Nebraska-Lincoln (UNL), United States of America (USA)	2.250000	0.23
Weber State University, United States of America (USA)	1.000000	0.10
Milwaukee School of Engineering, United States of America (USA)	1.000000	0.10
Leibniz-Institut für Kristallzüchtung im Forschungsverbund Berlin e.V. (IKZ), Germany	1.000000	0.10
Centre for III-Nitride Technology (C3NiT), Sweden	0.750000	0.08
Lund University (LU), Sweden	0.500000	0.05
Wallenberg Initiative Material Science for Sustainability (WISE), Sweden	0.500000	0.05

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