Spectral diffusion and indistinguishability in electrically injected silicon T centers

Journal:

Applied Physics Letters

Published:

2026-04-20

DOI:

10.1063/5.0323906

Affiliations:

1

Authors:

1

Go to article

Institutions	Authors	Share
ChangChun University of Science and Technology (CUST), China	1.000000	1.00

Interested in Quantum Physics?