Quantitative evaluation of sidewall impact in micro-LEDs by ultrafast-gated hyperspectral imaging microscopy

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0325822
Affiliations:
2
Authors:
9
Go to article
Institutions Authors Share
Xiamen University (XMU), China
8.000000
 0.89
Dongguan University of Technology (DGUT), China
1.000000
 0.11
Interested in Atomic, Molecular and Optical Physics?