Temperature-dependent resistivity and Seebeck coefficient in epitaxial La0.5Sr0.5CoO3 thin film
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0325942
- Affiliations:
- 4
- Authors:
- 6
| Institutions | Authors | Share |
|---|---|---|
| Institute of Light and Matter (ILM), France | 0.50 | |
| Lyon Nanotechnology Institute (INL), France | 0.33 | |
| Laboratoire de Physique de la Matière Condensée (PMC), France | 0.08 | |
| University of Picardie Jules Verne (UPJV), France | 0.08 |