Device variability of Josephson junctions induced by interface roughness
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0326249
- Affiliations:
- 2
- Authors:
- 3
| Institutions | Authors | Share |
|---|---|---|
| NanoAcademic Technologies Inc., Canada | 0.67 | |
| McGill University, Canada | 0.33 |