Comparative study of aging-induced optical and electrical degradation and dynamic stability in GaN-on-sapphire and GaN-on-GaN micro-LEDs

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0328148
Affiliations:
2
Authors:
14
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Institutions Authors Share
State Key Laboratory of Displays and Optoelectronics, China
12.500000
12.500000
 0.89
Southern University of Science and Technology (SUSTech), China
1.500000
 0.11
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