Improved ferroelectric properties in lanthanide-doped HfO2 thin films epitaxially grown on yttria-stabilized zirconia substrates
- Journal:
- Applied Physics Letters
- Published:
- DOI:
- 10.1063/5.0337202
- Affiliations:
- 2
- Authors:
- 13
| Institutions | Authors | Share |
|---|---|---|
| Qingdao University (QU), China | 1.00 |