Nanowire-based AFM-IR microscopy: Unveiling chemical structure at sub-10-nm resolution with silver nanowire–functionalized AFM probes

Journal:
Proceedings of the National Academy of Sciences of the United States of America
Published:
Affiliations:
4
Authors:
5
Institutions Authors Share
National Institute of Advanced Industrial Science and Technology (AIST), Japan
3.000000
0.60
Hokkaido University, Japan
1.333333
0.27
Catholic University of Leuven (KU Leuven), Belgium
0.333333
0.07
WPI Institute for Integrated Cell-Material Sciences (WPI-iCeMS), Kyoto University, Japan
0.333333
0.07