3D mapping of defects and moiré corrugations via electron ptychography atomic coordinate retrieval
- Journal:
- Science Advances
- Published:
- Affiliations:
- 5
- Authors:
- 6
| Institutions | Authors | Share |
|---|---|---|
| University of Illinois at Urbana-Champaign (UIUC), United States of America (USA) | 0.94 | |
| University of Maryland (UMD), United States of America (USA) | 0.06 |