3D mapping of defects and moiré corrugations via electron ptychography atomic coordinate retrieval

Journal:
Science Advances
Published:
Affiliations:
5
Authors:
6
Institutions Authors Share
University of Illinois at Urbana-Champaign (UIUC), United States of America (USA)
5.666667
0.94
University of Maryland (UMD), United States of America (USA)
0.333333
0.06