Imaging thick objects with deep-subangstrom resolution and deep-subpicometer precision

Journal:

Science Advances

Published:

2026-06-05

DOI:

10.1126/sciadv.aec9348

Affiliations:

3

Authors:

4

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Institutions	Authors	Share
Tsinghua University, China	1.333333	0.33
MOE Key Laboratory of Advanced Materials, Tsinghua, China	1.333333	0.33
State Key Laboratory of New Ceramics and Fine Processing, Tsinghua, China	1.333333	0.33