Carbon Nanotube Probes in Atomic Force Microscopy

Carbon nanotube (CNT) probes have emerged as a transformative advance in atomic force microscopy, combining sub-nanometre tip radii with exceptional mechanical resilience. Their high aspect ratio enables faithful imaging of steep or recessed features that elude conventional silicon tips, while their intrinsic wear resistance extends operational lifetime. Fabrication approaches span vapour-phase growth, solution-based attachment and direct pick-up techniques, each tailored to control nanotube length, orientation and anchoring strength. When integrated with modern imaging modes such as peak-force tapping or force spectroscopy, CNT probes deliver enhanced lateral resolution, reduced artefacts and precise force measurements. These capabilities have unlocked detailed mapping of biological macromolecules, high-aspect-ratio semiconductor structures and complex polymer morphologies. Despite remarkable progress, challenges persist in achieving reproducible attachment, stable feedback during dynamic scanning and consistent electrical or chemical functionalisation. Ongoing interdisciplinary efforts are refining growth kinetics, attachment mechanics and tip functionalisation to secure reliable, high-throughput production of CNT probes, thereby broadening their adoption across nanoscience, materials research and biotechnology.

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Carbon Nanotube Probes in Atomic Force Microscopy publication trend

The graph below shows the total number of articles in carbon nanotube probes in atomic force microscopy across all publications each year (not limited to Nature Index journals).

Technical terms

Carbon nanotube (CNT): Cylindrical nanostructure of one or more graphene layers rolled into a tube, prized for its high stiffness, electrical conductivity and nanoscale diameter.

Atomic force microscopy (AFM): Scanning probe technique that maps surface topography and forces by rastering a sharp tip across a sample and monitoring its deflection.

Aspect ratio: Ratio of probe length to diameter, determining ability to access deep or narrow features without tip–sample interference.

Dielectrophoresis: Electric-field-driven assembly technique that aligns and attaches nanotubes to a tip by exploiting their induced dipole moment.

Pick-up method: Manual or automated process in which an AFM tip is scanned over a CNT-covered substrate to adhere a nanotube to its apex via van der Waals forces and subsequent stabilisation.

References

1. Controlled growth of a single carbon nanotube on an AFM probe. Microsystems & Nanoengineering (2021).
2. Solution Based Methods for the Fabrication of Carbon Nanotube Modified Atomic Force Microscopy Probes. Nanomaterials (2017).
3. Improved Application of Carbon Nanotube Atomic Force Microscopy Probes Using PeakForce Tapping Mode. Nanomaterials (2018).
4. The Attachment of Carbon Nanotubes to Atomic Force Microscopy Tips Using the Pick-Up Method. Applied Sciences (2020).
5. Structural biology with carbon nanotube AFM probes. Cell Chemical Biology (2000).
6. Cooperative Multiwalled Carbon Nanotubes for Enhanced Force Spectroscopy. e-Journal of Surface Science and Nanotechnology (2012).