An optimized thermal evaporation process for tin-based perovskites enables precise strain engineering in the perovskite layer, resulting in perovskite light-emitting diodes with a half-lifetime of 1,250 h at a constant current density of 100 mA cm−2 and a peak external quantum efficiency of 6.6% for emission at 944 nm.
- Weidong Tang
- Gan Zhang
- Dawei Di